Eika Sandnes, Frode, Institute of Information Technology, Faculty of Technology, Art and Design, Oslo and Akershus University College of Applied Sciences, Oslo, Norway. Westerdals Oslo School of Art, Communication and Technology, Oslo, Norway.

• Vol 9, No 2-5: Circuit and System Advancement in Modern World IV - Articles
  Reducing False Detection during Inspection of HDD using Super Resolution Image Processing and Deep Learning
  Abstract  PDF